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Measurement and Modeling of Silicon Heterostructure Devices

Measurement and Modeling of Silicon Heterostructure Devices Image

Book Details:

Publisher:CRC Press
Series: CRC Press
Author:John D. Cressler
Edition:1
ISBN-10:1420066927
ISBN-13:9781420066920
Pages:200
Published:Dec 13 2007
Posted:Nov 19 2014
Language:English
Book format:PDF
Book size:2.81 MB

Book Description:

When you see a nicely presented set of data, the natural response is: How did they do that; what tricks did they use; and how can I do that for myself? Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually held close to the vest and rarely divulged. Shamefully ignored in the technical literature, measurement and modeling of high-speed semiconductor devices is a fine art. Robust measuring and modeling at the levels of performance found in modern SiGe devices requires extreme dexterity in the laboratory to obtain reliable data, and then a valid model to fit that data. Drawn from the comprehensive and well-reviewed Silicon Heterostructure Handbook, this volume focuses on measurement and modeling of high-speed silicon heterostructure devices. The chapter authors provide experience-based tricks-of-the-trade and the subtle nuances of measuring and modeling advanced devices, making this an important reference for the semiconductor industry. It includes easy-to-reference appendices covering topics such as the properties of silicon and germanium, the generalized Moll-Ross relations, the integral charge-control model, and sample SiGe HBT compact model parameters.

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